Move TEST_SKIPPED_ITSELF to test_status in testHarness (#1089)
TEST_SKIPPED_ITSELF was originally located in threadTesting.h but this no longer makes sense. This change moves the definition to the test_status struct in testHarness so that it can be used in the same way that test_status' can be used. Signed-off-by: Chetankumar Mistry <chetan.mistry@arm.com>
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3 changed files with 3 additions and 2 deletions
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@ -480,6 +480,7 @@ int runTestHarnessWithCheck(int argc, const char *argv[], int testNum,
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case TEST_PASS: break;
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case TEST_FAIL: return fail_init_info(testNum);
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case TEST_SKIP: return skip_init_info(testNum);
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case TEST_SKIPPED_ITSELF: return skip_init_info(testNum);
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}
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}
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}
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@ -493,6 +494,7 @@ int runTestHarnessWithCheck(int argc, const char *argv[], int testNum,
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case TEST_PASS: break;
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case TEST_FAIL: return fail_init_info(testNum);
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case TEST_SKIP: return skip_init_info(testNum);
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case TEST_SKIPPED_ITSELF: return skip_init_info(testNum);
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}
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}
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@ -80,6 +80,7 @@ typedef enum test_status
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TEST_PASS = 0,
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TEST_FAIL = 1,
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TEST_SKIP = 2,
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TEST_SKIPPED_ITSELF = -100,
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} test_status;
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extern int gFailCount;
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@ -22,8 +22,6 @@
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#include <CL/opencl.h>
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#endif
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#define TEST_SKIPPED_ITSELF -100
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typedef int (*basefn)(cl_device_id deviceID, cl_context context,
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cl_command_queue queue, int num_elements);
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extern int test_threaded_function(basefn fnToTest, cl_device_id device,
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